An Introduction to Mixed-Signal IC Test and Measurement (Oxford Series in Electrical and Computer Engineering) |  | Authors: Mark Burns, Gordon W. Roberts
Publisher: Oxford University Press, USA
Category: Book
List Price: $149.00
Buy New: $58.93
as of 2/7/2012 03:15 PST details
You Save: $90.07 (60%)
In Stock
New (24) Used (36) from $20.02
Seller: toanna
Languages: English (Unknown), English (Original Language), English (Published)
Media: Hardcover
Pages: 704
Number Of Items: 1
Shipping Weight (lbs): 3.1
Dimensions (in): 9.3 x 7.7 x 1.4
ISBN: 0195140168
EAN: 9780195140163
Availability: Usually ships in 1-2 business days
| |
| Similar Items:
| |
| Editorial Reviews:
Product Description
Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.
An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.
This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial technology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly discussed, and the role of the test engineer is clearly defined.
|
| |
| In Stock
|
|
|
